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This team is from the Department of Science and Engineering at Kansai College. The ruler they developed is based on silicon carbide, which is second only to diamonds. Silicon carbide is hard and difficult to process, and researchers have developed a new processing technology. They heated the silicon carbide into an ultra-vacuum environment to about 2000 degrees Celsius and then cut the surface.
Using this processing technology, the researchers succeeded in forming a stepped structure on the surface of the silicon carbide material. The "step" of each step of the step is 0.5 nanometer, which is equivalent to a scale of the ruler. According to reports, the researchers can also make the height of the "step" 0.76 nm and 1 nm.
Researchers say that this ultra-precision ruler can be widely used in many fields involving nanotechnology, such as ultra-precision instruments, computer central processing units, and large-scale integrated circuits. The new ruler's corrosion resistance is also superior to the traditional silicon precision ruler.
Developed ultra-precision ruler for measuring nanometer size with silicon carbide as the main material.
A research team at Kansai University in Japan announced on the 20th that they have developed an ultra-precision ruler that can be used to measure nanometer-scale dimensions.